Tektronix has expanded its portfolio of power measurement solutions with the introduction of wideband shunts for IsoVu isolated current probes and the new THDP0400 high-voltage differential probe. The additions are designed to support engineers working on next-generation power electronics by enabling accurate measurements across applications ranging from low-current analysis to high-voltage switching evaluation.
As silicon carbide (SiC) and gallium nitride (GaN) devices become increasingly common in power systems, engineers face greater challenges in measuring higher voltages, faster switching speeds, and smaller currents with high accuracy. Tektronix developed these new tools to address those requirements while maintaining signal quality and reducing measurement noise.
The newly introduced wideband shunts are the first shunt-based accessories within the Tektronix IsoVu current measurement platform. Designed for low-current, high-bandwidth applications, they provide improved sensitivity and fast transient capture where traditional clamp probes or standard shunts may fall short. These capabilities make them suitable for power integrity studies and power distribution network analysis in semiconductor, embedded computing, and AI infrastructure designs.
Offering bandwidths of up to 250 MHz, the shunts work directly with Tektronix IsoVu isolated current probes. They include integrated communication, automatic temperature compensation, and built-in fuse protection to simplify operation, improve measurement accuracy, and safeguard both instruments and test devices.
Tektronix has also expanded its THDP probe family with the THDP0400, featuring 400 MHz bandwidth and a differential input range of ±2000 V. The probe is designed for floating high-voltage measurements commonly required during power electronics testing and wide-bandgap semiconductor development.
The THDP0400 connects directly through the TekVPI interface and is compatible with Tektronix 4 Series B, 5 Series B, and 6 Series B mixed-signal oscilloscopes, eliminating the need for an external power supply. It is well-suited for applications including SiC and GaN device characterization, power converter validation, and double-pulse testing where precise capture of fast switching events is critical.
With these latest additions, Tektronix strengthens its measurement solutions for developers of advanced power electronics used in electric vehicles, industrial systems, AI data centers, and other high-performance applications. Both products are available immediately.
