BEAVERTON, Oregon – Tektronix has introduces KTE V7.1 software for Keithley’s S530 series parametric test system, accelerating the manufacture of semiconductor chips – exactly when the world market needs it most.
The new options available for the first time with the KTE V7.1 version include a new parallel test function and an innovative high-voltage capacity test option for new power and wide-bandgap applications. KTE V7.1 shortens the test times compared to KTE V5.8 by more than 10 percent. So engineers can reduce their downtime and manufacture chips faster.
5G and the growth of the Internet of Things have fueled global demand for semiconductors. Global bottlenecks not only require increased production, but also faster options for testing newly developed chips. The new Tektronix test system enables faster production through shorter test times and thus accelerates the delivery of new chips to the market.
“The new analog, wide-bandgap (SiC and GaN) and power semiconductor technologies of today require parametric tests to maximize measurement performance, to cover a wide product mix and to minimize costs,” says Peter Griffiths, General Manager, Systems & Software at Tektronix . “Our customers as well as the world’s largest chip manufacturers benefit from the improvements in KTE V7.1, with which engineers can develop innovations at an unprecedented speed and thus meet the requirements of the changing markets”.
The new version KTE V7.1 builds on the functional and throughput improvements that the S530 system has achieved since the release of KTE 7.0. The new probe design offers flexibility when using different probe cards. The updated software and hardware enables single-pass tests and high throughput. For service, the recently introduced System Reference Unit (SRU) shortens the calibration time to less than eight hours, so that a calibration can be completed in a regular work shift. The SRUs can be purchased directly or with an annual SSO service plan.
Significant improvements and innovations in the industry Parallel test options to further increase productivity and reduce test costs
The S530 is available for the first time as an option in the KTE V7.1 version and now has a powerful option for parallel tests, which further increases productivity and lowers test costs with an estimated saving of 30% (depending on tests and structures). Based on the innovative hardware architecture of the S530, with which up to eight high-resolution SMUs can be connected to any test pin via any Kelvin port or any row in the system, Keithley’s parallel test software optimizes the efficiency of all system resources and maximizes test throughput.
Innovative high-voltage capacity tests for new applications in the areas of power and wide bandgap
For today’s engineers, high voltages are essential for component testing. There is a growing demand for chips with higher switching speeds and more efficient switching operations. Higher efficiency not only reduces power consumption and heat generation, it is also better for our environment. To test these components with a wide band gap at higher operating voltages, engineers move from the R&D laboratory to production. KTE V7.1 with the special option HVCV (High Voltage Capacitance Voltage) is an innovative offer. In combination with the industry’s only single-pass test solution for measurements between 200V and 1000V, capacities can be tested with a bias voltage of up to 1100V DC. This production-ready capability enables precise measurements of Cdg, Cgs and Cds that allow characterization and testing of the transient input and output power of a power device.
Tests up to 1100V on each pin with a single probe touchdown
In addition to the ability to supply and measure up to 1100V, up to two 2470 SMUs can be configured in an S530-HV system, and the high-voltage switching matrix of the S530-HV allows the user to perform these measurements on any test pin at any time. This ensures maximum flexibility and meets the pin-out requirements of a large number of test objects and structures. It also eliminates the throughput delays and higher costs associated with two-pass testing or dedicated pins.
For more information, please visit at de.tek.com.
